Multivariate statistical analysis of time-of-flight secondary ion mass spectrometry images using AXSIA: Fid-Bau Portal

Multivariate statistical analysis of time-of-flight secondary ion mass spectrometry images using AXSIA

Ohlhausen, J. A. T. / Keenan, M. R. / Kotula, P. G. / Peebles, D. E.

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Multivariate statistical analysis of time-of-flight secondary ion mass spectrometry images using AXSIA

Ohlhausen, J. A. T. / Keenan, M. R. / Kotula, P. G. / Peebles, D. E.

Multivariate statistical analysis of time-of-flight secondary ion mass spectrometry images using AXSIA

Ohlhausen, J. A. T. / Keenan, M. R. / Kotula, P. G. / Peebles, D. E.

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Check availability in my library

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Document information

Title:

Multivariate statistical analysis of time-of-flight secondary ion mass spectrometry images using AXSIA

Contributors:

Ohlhausen, J. A. T. (author) / Keenan, M. R. (author) / Kotula, P. G. (author) / Peebles, D. E. (author)

Published in:

APPLIED SURFACE SCIENCE ; 231/232 ; 230-234

Publication date:

2004-01-01

Size:

5 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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