Characterization of adsorbed protein films using time-of-flight-secondary ion mass spectrometry and multivariate analysis

Wagner, M. S. / Castner, D. G. | British Library Online Contents | 2003

Quantitative time-of-flight secondary ion mass spectrometry for the characterization of multicomponent adsorbed protein films

Wagner, M. S. / Shen, M. / Horbett, T. A. et al. | British Library Online Contents | 2003

Quantitative static Time-of-Flight Secondary Ion Mass Spectrometry analysis of anionic minority species in microelectronic substrates

Ravanel, X. / Trouiller, C. / Juhel, M. et al. | British Library Online Contents | 2008

Static time-of-flight secondary ion mass spectrometry analysis of microelectronics related substrates using a polyatomic ion source

Ravanel, X. / Trouiller, C. / Juhel, M. et al. | British Library Online Contents | 2008

Analysis of surfactants adsorbed on cement using secondary ion mass spectrometry (SIMS)

Nägele, E. / Schneider, U. | Elsevier | 1985