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Improved near surface characterization of shallow arsenic distribution by SIMS depth profiling

Buyuklimanli, T. H. / Marino, J. W. / Novak, S. W.

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Improved near surface characterization of shallow arsenic distribution by SIMS depth profiling

Buyuklimanli, T. H. / Marino, J. W. / Novak, S. W.

Improved near surface characterization of shallow arsenic distribution by SIMS depth profiling

Buyuklimanli, T. H. / Marino, J. W. / Novak, S. W.

Access

Access via TIB

Check availability in my library

Order at Subito €

Page navigation

Document information

Similar titles

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Document information

Title:

Improved near surface characterization of shallow arsenic distribution by SIMS depth profiling

Contributors:

Buyuklimanli, T. H. (author) / Marino, J. W. (author) / Novak, S. W. (author)

Published in:

APPLIED SURFACE SCIENCE ; 231/232 ; 636-639

Publication date:

2004-01-01

Size:

4 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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