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    SIMS analysis of impurities and nitrogen isotopes in gallium nitride thin films

    New search for: Haneda, H.
    New search for: Ohgaki, T.
    New search for: Sakaguchi, I.
    New search for: Ryoken, H.
    New search for: Ohashi, N.
    New search for: Yasumori, A.

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    SIMS analysis of impurities and nitrogen isotopes in gallium nitride thin films

    New search for: Haneda, H.
    New search for: Ohgaki, T.
    New search for: Sakaguchi, I.
    New search for: Ryoken, H.
    New search for: Ohashi, N.
    New search for: Yasumori, A.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    SIMS analysis of impurities and nitrogen isotopes in gallium nitride thin films

    New search for: Haneda, H.
    New search for: Ohgaki, T.
    New search for: Sakaguchi, I.
    New search for: Ryoken, H.
    New search for: Ohashi, N.
    New search for: Yasumori, A.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    SIMS analysis of impurities and nitrogen isotopes in gallium nitride thin films

    Contributors:

    Haneda, H. (author) / Ohgaki, T. (author) / Sakaguchi, I. (author) / Ryoken, H. (author) / Ohashi, N. (author) / Yasumori, A. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 252 ; 7265-7268

    Publication date:

    2006-01-01

    Size:

    4 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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