A platform for research: civil engineering, architecture and urbanism
Non-Contact Measurement of Dielectric Constant for a Nanometer-Thick Polymer Film
Non-Contact Measurement of Dielectric Constant for a Nanometer-Thick Polymer Film
Non-Contact Measurement of Dielectric Constant for a Nanometer-Thick Polymer Film
Park, G. (author) / Hur, Y. (author) / Kim, J. H. (author) / Kim, S. H. (author) / Keum, S. R. (author) / Koh, K. (author) / Lee, S.-S. / Yoon, D.-J. / Lee, J.-H. / Lee, S.
2004-01-01
4 pages
Article (Journal)
English
DDC:
620.11
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Characterization of a nanometer-thick sputtered polytetrafluoroethylene film
British Library Online Contents | 2011
|Measurement of the elastic constants of nanometer-thick films
British Library Online Contents | 2002
|Simulations of Nanometer-Thick Lubricating Films
British Library Online Contents | 1993
|Inkjet Printing of Oxidants for Patterning of Nanometer-Thick Conducting Polymer Electrodes
British Library Online Contents | 2006
|Residual Strains in a Nanometer Thick Cr Film Measured on Micromachined Beams
British Library Online Contents | 2009
|