Impact of a Combined Use of Focused Ion Beam Technique and Transmission Electron Microscopy on Materials Characterization: Fid-Bau Portal

Impact of a Combined Use of Focused Ion Beam Technique and Transmission Electron Microscopy on Materials Characterization

Saka, H.

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Impact of a Combined Use of Focused Ion Beam Technique and Transmission Electron Microscopy on Materials Characterization

Saka, H.

Impact of a Combined Use of Focused Ion Beam Technique and Transmission Electron Microscopy on Materials Characterization

Saka, H.

Access

Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Impact of a Combined Use of Focused Ion Beam Technique and Transmission Electron Microscopy on Materials Characterization

Contributors:

Saka, H. (author)

Published in:

MATERIALS SCIENCE FORUM ; 475/479 ; 9-20

Publication date:

2005-01-01

Size:

12 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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