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    Plan-view observation of crack tips by focused ion beam/transmission electron microscopy

    New search for: Saka, H.
    New search for: Abe, S.
    New search for: Lukas, P.

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    Plan-view observation of crack tips by focused ion beam/transmission electron microscopy

    New search for: Saka, H.
    New search for: Abe, S.
    New search for: Lukas, P.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Plan-view observation of crack tips by focused ion beam/transmission electron microscopy

    New search for: Saka, H.
    New search for: Abe, S.
    New search for: Lukas, P.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Plan-view observation of crack tips by focused ion beam/transmission electron microscopy

    Contributors:

    Saka, H. (author) / Abe, S. (author) / Lukas, P.

    Published in:

    11th International Conference on the Strength of Materials ; 552-554

    MATERIALS SCIENCE AND ENGINEERING -LAUSANNE- A ; 234/236

    Publication date:

    1997-01-01

    Size:

    3 pages

    ISSN:

    0921-5093

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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