Microdiffraction Study of Polycrystalline Copper during Uniaxial Tension Deformation Using a Synchrotron X-Ray Source: Fid-Bau Portal

Microdiffraction Study of Polycrystalline Copper during Uniaxial Tension Deformation Using a Synchrotron X-Ray Source

Joo, H. D. / Kim, J. S. / Bark, C. W. / Kim, J. Y. / Koo, Y. M. / Tamura, N.

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Microdiffraction Study of Polycrystalline Copper during Uniaxial Tension Deformation Using a Synchrotron X-Ray Source

Joo, H. D. / Kim, J. S. / Bark, C. W. / Kim, J. Y. / Koo, Y. M. / Tamura, N.

Microdiffraction Study of Polycrystalline Copper during Uniaxial Tension Deformation Using a Synchrotron X-Ray Source

Joo, H. D. / Kim, J. S. / Bark, C. W. / Kim, J. Y. / Koo, Y. M. / Tamura, N.

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Document information

Title:

Microdiffraction Study of Polycrystalline Copper during Uniaxial Tension Deformation Using a Synchrotron X-Ray Source

Contributors:

Joo, H. D. (author) / Kim, J. S. (author) / Bark, C. W. (author) / Kim, J. Y. (author) / Koo, Y. M. (author) / Tamura, N. (author)

Published in:

MATERIALS SCIENCE FORUM ; 475/479 ; 4149-4152

Publication date:

2005-01-01

Size:

4 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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