Fachinformationsdienst BAUdigital

A platform for research: civil engineering, architecture and urbanism

    8.3 kV 4H-SiC PiN Diode on (0001) C-Face with Small Forward Voltage Degradation

    New search for: Nakayama, K.
    New search for: Sugawara, Y.
    New search for: Tsuchida, H.
    New search for: Miyanagi, T.
    New search for: Kamata, I.
    New search for: Nakamura, T.
    New search for: Asano, K.
    New search for: Ishii, R.
    New search for: Nipoti, R.
    New search for: Poggi, A.
    New search for: Scorzoni, A.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    8.3 kV 4H-SiC PiN Diode on (0001) C-Face with Small Forward Voltage Degradation

    New search for: Nakayama, K.
    New search for: Sugawara, Y.
    New search for: Tsuchida, H.
    New search for: Miyanagi, T.
    New search for: Kamata, I.
    New search for: Nakamura, T.
    New search for: Asano, K.
    New search for: Ishii, R.
    New search for: Nipoti, R.
    New search for: Poggi, A.
    New search for: Scorzoni, A.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    8.3 kV 4H-SiC PiN Diode on (0001) C-Face with Small Forward Voltage Degradation

    New search for: Nakayama, K.
    New search for: Sugawara, Y.
    New search for: Tsuchida, H.
    New search for: Miyanagi, T.
    New search for: Kamata, I.
    New search for: Nakamura, T.
    New search for: Asano, K.
    New search for: Ishii, R.
    New search for: Nipoti, R.
    New search for: Poggi, A.
    New search for: Scorzoni, A.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    8.3 kV 4H-SiC PiN Diode on (0001) C-Face with Small Forward Voltage Degradation

    Contributors:

    Nakayama, K. (author) / Sugawara, Y. (author) / Tsuchida, H. (author) / Miyanagi, T. (author) / Kamata, I. (author) / Nakamura, T. (author) / Asano, K. (author) / Ishii, R. (author) / Nipoti, R. / Poggi, A.

    Published in:

    Silicon Carbide and Related Materials 2004 ; 969-972

    MATERIALS SCIENCE FORUM ; 483/485

    Publication date:

    2005-01-01

    Size:

    4 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

    Similar titles

    Dynamic Characteristics of 4H-SiC pin Diode on (000-1)C-Face with Small Forward Degradation

    Nakayama, K. / Sugawara, Y. / Ishii, R. et al. | British Library Online Contents | 2006

    Development of 3.3 kV SiC-MOSFET: Suppression of Forward Voltage Degradation of the Body Diode

    Yamamoto, S. / Nakao, Y. / Tomita, N. et al. | British Library Online Contents | 2014

    6.2kV 4H-SiC pin Diode with Low Forward Voltage Drop

    Sugawara, Y. / Asano, K. / Singh, R. et al. | British Library Online Contents | 2000

    Photoemission study of 6H-SiC(0001)Si face

    Jikimoto, T. / Tsukamoto, T. / Kinoshita, A. et al. | British Library Online Contents | 1997

    Electrical Properties of pn Diodes on 4H-SiC(0001) C-Face and (1120) Face

    Tanaka, Y. / Kojima, K. / Suzuki, T. et al. | British Library Online Contents | 2004

    Back to top