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Physical Simulation of Drain-Induced Barrier Lowering Effect in SiC MESFETs
Physical Simulation of Drain-Induced Barrier Lowering Effect in SiC MESFETs
Physical Simulation of Drain-Induced Barrier Lowering Effect in SiC MESFETs
Zhu, C. L. (author) / Rusli (author) / Almira, J. (author) / Tin, C. C. (author) / Yoon, S. F. (author) / Ahn, J. (author) / Nipoti, R. / Poggi, A. / Scorzoni, A.
2005-01-01
4 pages
Article (Journal)
English
DDC:
620.11
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