High-resolution TEM characterization of MOVPE-grown (111)-BP layer on hexagonal 6H (0001)-SiC: Fid-Bau Portal

High-resolution TEM characterization of MOVPE-grown (111)-BP layer on hexagonal 6H (0001)-SiC

Udagawa, T. / Odawara, M. / Shimaoka, G.

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High-resolution TEM characterization of MOVPE-grown (111)-BP layer on hexagonal 6H (0001)-SiC

Udagawa, T. / Odawara, M. / Shimaoka, G.

High-resolution TEM characterization of MOVPE-grown (111)-BP layer on hexagonal 6H (0001)-SiC

Udagawa, T. / Odawara, M. / Shimaoka, G.

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Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

High-resolution TEM characterization of MOVPE-grown (111)-BP layer on hexagonal 6H (0001)-SiC

Contributors:

Udagawa, T. (author) / Odawara, M. (author) / Shimaoka, G. (author)

Published in:

APPLIED SURFACE SCIENCE ; 244 ; 285-288

Publication date:

2005-01-01

Size:

4 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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