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    Optical properties of rough LaNiO3 thin films studied by spectroscopic ellipsometry and reflectometry

    New search for: Mistrik, J.
    New search for: Yamaguchi, T.
    New search for: Franta, D.
    New search for: Ohlidal, I.
    New search for: Hu, G. J.
    New search for: Dai, N.

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    Optical properties of rough LaNiO3 thin films studied by spectroscopic ellipsometry and reflectometry

    New search for: Mistrik, J.
    New search for: Yamaguchi, T.
    New search for: Franta, D.
    New search for: Ohlidal, I.
    New search for: Hu, G. J.
    New search for: Dai, N.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Optical properties of rough LaNiO3 thin films studied by spectroscopic ellipsometry and reflectometry

    New search for: Mistrik, J.
    New search for: Yamaguchi, T.
    New search for: Franta, D.
    New search for: Ohlidal, I.
    New search for: Hu, G. J.
    New search for: Dai, N.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Optical properties of rough LaNiO3 thin films studied by spectroscopic ellipsometry and reflectometry

    Contributors:

    Mistrik, J. (author) / Yamaguchi, T. (author) / Franta, D. (author) / Ohlidal, I. (author) / Hu, G. J. (author) / Dai, N. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 244 ; 431-434

    Publication date:

    2005-01-01

    Size:

    4 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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