Fachinformationsdienst BAUdigital

A platform for research: civil engineering, architecture and urbanism

    Optical properties of post-annealed ZnO:Al thin films studied by spectroscopic ellipsometry

    New search for: Hwang, Y.H.
    New search for: Kim, H.M.
    New search for: Um, Y.H.
    New search for: Park, H.Y.
    New search for: Boo, J.-H.
    New search for: Ahn, H.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Optical properties of post-annealed ZnO:Al thin films studied by spectroscopic ellipsometry

    New search for: Hwang, Y.H.
    New search for: Kim, H.M.
    New search for: Um, Y.H.
    New search for: Park, H.Y.
    New search for: Boo, J.-H.
    New search for: Ahn, H.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Optical properties of post-annealed ZnO:Al thin films studied by spectroscopic ellipsometry

    New search for: Hwang, Y.H.
    New search for: Kim, H.M.
    New search for: Um, Y.H.
    New search for: Park, H.Y.
    New search for: Boo, J.-H.
    New search for: Ahn, H.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Optical properties of post-annealed ZnO:Al thin films studied by spectroscopic ellipsometry

    Contributors:

    Hwang, Y.H. (author) / Kim, H.M. (author) / Um, Y.H. (author) / Park, H.Y. (author) / Boo, J.-H. / Ahn, H.

    Published in:

    Proceedings of the IFFM2011 (2011 International Forum on Functional Materials) and AFM-2 (2nd Special Symposium on Advances in Functional Materials) Jeju island, Korea 28-31 July 2011 ; 2898-2901

    MATERIALS RESEARCH BULLETIN ; 47

    Publication date:

    2012-01-01

    Size:

    4 pages

    ISSN:

    0025-5408

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11 / 620

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

    Similar titles

    Optical properties of rough LaNiO3 thin films studied by spectroscopic ellipsometry and reflectometry

    Mistrik, J. / Yamaguchi, T. / Franta, D. et al. | British Library Online Contents | 2005

    Optical properties of excimer laser annealed polycrystalline Si by spectroscopic ellipsometry

    Yu, G. / Soga, T. / Shao, C. L. et al. | British Library Online Contents | 1997

    Albumin adsorption on oxide thin films studied by spectroscopic ellipsometry

    Silva-Bermudez, P. / Rodil, S. E. / Muhl, S. | British Library Online Contents | 2011

    Stabilization in electrical characteristics of hydrogen-annealed ZnO:Al films

    Oh, B. Y. / Jeong, M. C. / Myoung, J. M. | British Library Online Contents | 2007

    Optical properties of Au–TiO2 and Au–SiO2 granular metal thin films studied by Spectroscopic Ellipsometry

    Bakkali, H. / Blanco, E. / Dominguez, M. et al. | British Library Online Contents | 2017

    Back to top