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    Thickness dependence of properties of ZnO:Ga films deposited by rf magnetron sputtering

    New search for: Yu, X.
    New search for: Ma, J.
    New search for: Ji, F.
    New search for: Wang, Y.
    New search for: Cheng, C.
    New search for: Ma, H.

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    Thickness dependence of properties of ZnO:Ga films deposited by rf magnetron sputtering

    New search for: Yu, X.
    New search for: Ma, J.
    New search for: Ji, F.
    New search for: Wang, Y.
    New search for: Cheng, C.
    New search for: Ma, H.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Thickness dependence of properties of ZnO:Ga films deposited by rf magnetron sputtering

    New search for: Yu, X.
    New search for: Ma, J.
    New search for: Ji, F.
    New search for: Wang, Y.
    New search for: Cheng, C.
    New search for: Ma, H.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Thickness dependence of properties of ZnO:Ga films deposited by rf magnetron sputtering

    Contributors:

    Yu, X. (author) / Ma, J. (author) / Ji, F. (author) / Wang, Y. (author) / Cheng, C. (author) / Ma, H. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 245 ; 310-315

    Publication date:

    2005-01-01

    Size:

    6 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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