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    XPS analysis of ZnO:Ga films deposited by magnetron sputtering: Substrate bias effect

    New search for: Correia, F.C.
    New search for: Bundaleski, N.
    New search for: Teodoro, O.M.N.D.
    New search for: Correia, M.R.
    New search for: Rebouta, L.
    New search for: Mendes, A.
    New search for: Tavares, C.J.

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    XPS analysis of ZnO:Ga films deposited by magnetron sputtering: Substrate bias effect

    New search for: Correia, F.C.
    New search for: Bundaleski, N.
    New search for: Teodoro, O.M.N.D.
    New search for: Correia, M.R.
    New search for: Rebouta, L.
    New search for: Mendes, A.
    New search for: Tavares, C.J.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    XPS analysis of ZnO:Ga films deposited by magnetron sputtering: Substrate bias effect

    New search for: Correia, F.C.
    New search for: Bundaleski, N.
    New search for: Teodoro, O.M.N.D.
    New search for: Correia, M.R.
    New search for: Rebouta, L.
    New search for: Mendes, A.
    New search for: Tavares, C.J.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
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    Document information
    Title:

    XPS analysis of ZnO:Ga films deposited by magnetron sputtering: Substrate bias effect

    Contributors:

    Correia, F.C. (author) / Bundaleski, N. (author) / Teodoro, O.M.N.D. (author) / Correia, M.R. (author) / Rebouta, L. (author) / Mendes, A. (author) / Tavares, C.J. (author)

    Published in:

    Applied surface science ; 458 ; 1043-1049

    Publication date:

    2018-01-01

    Size:

    7 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.44

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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