Development of a Large Range Nanometer Level Profilometer with Controlled Contact Force: Fid-Bau Portal

Development of a Large Range Nanometer Level Profilometer with Controlled Contact Force

Yang, L. / Gao, Y. / Wang, X. / Xie, T.

Access

Access via TIB

Check availability in my library

Order at Subito €

Page navigation

Document information

Similar titles

Export, share and cite

Development of a Large Range Nanometer Level Profilometer with Controlled Contact Force

Yang, L. / Gao, Y. / Wang, X. / Xie, T.

Development of a Large Range Nanometer Level Profilometer with Controlled Contact Force

Yang, L. / Gao, Y. / Wang, X. / Xie, T.

Access

Access via TIB

Check availability in my library

Order at Subito €

Page navigation

Document information

Similar titles

Export, share and cite

Document information

Title:

Development of a Large Range Nanometer Level Profilometer with Controlled Contact Force

Contributors:

Yang, L. (author) / Gao, Y. (author) / Wang, X. (author) / Xie, T. (author) / Gao, Y. / Tse, S. / Gao, W.

Published in:

Measurement Technology and Intelligent Instruments VI ; 489-494

KEY ENGINEERING MATERIALS ; 295/296

Publication date:

2005-01-01

Size:

6 pages

ISSN:

1013-9826

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

Yang, X.D. / Li, J.C. / Xie, T.B. | British Library Online Contents | 2008

Profilometer for Tubes

R. A. Livingston | NTIS | 1986

A Contact Stylus Profilometer Based on Linnik Interference Microscope

Yun, J.P. / Zhang, L.L. / Xie, T.B. et al. | British Library Online Contents | 2008

Profilometer measures smoothness

McGuire, D.D. | Engineering Index Backfile | 1926

Airborne 3-D Profilometer

Haggrén, H. | Online Contents | 1996