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Force-Calibrated AFM for Mechanical Test of Freestanding Thin Films

Lee, H. J. / Cho, K. H. / Kim, J. H. / Han, S. W. / Choi, B. I. / Baek, C. W. / Kim, J. M. / Choa, S. H.

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Force-Calibrated AFM for Mechanical Test of Freestanding Thin Films

Lee, H. J. / Cho, K. H. / Kim, J. H. / Han, S. W. / Choi, B. I. / Baek, C. W. / Kim, J. M. / Choa, S. H.

Force-Calibrated AFM for Mechanical Test of Freestanding Thin Films

Lee, H. J. / Cho, K. H. / Kim, J. H. / Han, S. W. / Choi, B. I. / Baek, C. W. / Kim, J. M. / Choa, S. H.

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Check availability in my library

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Document information

Title:

Force-Calibrated AFM for Mechanical Test of Freestanding Thin Films

Contributors:

Lee, H. J. (author) / Cho, K. H. (author) / Kim, J. H. (author) / Han, S. W. (author) / Choi, B. I. (author) / Baek, C. W. (author) / Kim, J. M. (author) / Choa, S. H. (author) / Kim, Y.-J. / Bae, D.-H.

Published in:

Advances in Fracture and Strength ; 275-279

KEY ENGINEERING MATERIALS ; 297/300

Publication date:

2005-01-01

Size:

5 pages

ISSN:

1013-9826

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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