A platform for research: civil engineering, architecture and urbanism
Accurate and efficient TCAD model for the formation and dissolution of small interstitial clusters and {311} defects in silicon
Accurate and efficient TCAD model for the formation and dissolution of small interstitial clusters and {311} defects in silicon
Accurate and efficient TCAD model for the formation and dissolution of small interstitial clusters and {311} defects in silicon
Zechner, C. (author) / Zographos, N. (author) / Matveev, D. (author) / Erlebach, A. (author)
MATERIALS SCIENCE AND ENGINEERING B -LAUSANNE- ; 124-125 ; 401-403
2005-01-01
3 pages
Article (Journal)
English
DDC:
620.11
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
New Type of Defects Explored by Theory: Silicon Interstitial Clusters in SiC
British Library Online Contents | 2009
|Interstitial carbon-hydrogen defects in silicon
British Library Online Contents | 1997
|Silicon germanium interdiffusion in SiGe device fabrication: A calibrated TCAD model
British Library Online Contents | 2016
|British Library Online Contents | 2008
|Boron-interstitial clusters in crystalline silicon: stoichiometry and strain
British Library Online Contents | 2004
|