Optical and structural study of Ge/Si quantum dots on Si(100) surface covered with a thin silicon oxide layer: Fid-Bau Portal

Optical and structural study of Ge/Si quantum dots on Si(100) surface covered with a thin silicon oxide layer

Fonseca, A. / Alves, E. / Leitao, J. P. / Sobolev, N. A. / Carmo, M. C. / Nikiforov, A. I.

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Optical and structural study of Ge/Si quantum dots on Si(100) surface covered with a thin silicon oxide layer

Fonseca, A. / Alves, E. / Leitao, J. P. / Sobolev, N. A. / Carmo, M. C. / Nikiforov, A. I.

Optical and structural study of Ge/Si quantum dots on Si(100) surface covered with a thin silicon oxide layer

Fonseca, A. / Alves, E. / Leitao, J. P. / Sobolev, N. A. / Carmo, M. C. / Nikiforov, A. I.

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Document information

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Document information

Title:

Optical and structural study of Ge/Si quantum dots on Si(100) surface covered with a thin silicon oxide layer

Contributors:

Fonseca, A. (author) / Alves, E. (author) / Leitao, J. P. (author) / Sobolev, N. A. (author) / Carmo, M. C. (author) / Nikiforov, A. I. (author)

Published in:

MATERIALS SCIENCE AND ENGINEERING B -LAUSANNE- ; 124-125 ; 462-465

Publication date:

2005-01-01

Size:

4 pages

ISSN:

0921-5107

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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