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    Capacitance–voltage profile characteristics of Schottky barrier structure with InAs quantum dots grown on InAlAs/InP(001)

    New search for: Baira, M.
    New search for: Ajjel, R.
    New search for: Maaref, H.
    New search for: Salem, B.
    New search for: Brémond, G.
    New search for: Gendry, M.
    New search for: Marty, O.

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    Capacitance–voltage profile characteristics of Schottky barrier structure with InAs quantum dots grown on InAlAs/InP(001)

    New search for: Baira, M.
    New search for: Ajjel, R.
    New search for: Maaref, H.
    New search for: Salem, B.
    New search for: Brémond, G.
    New search for: Gendry, M.
    New search for: Marty, O.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Capacitance–voltage profile characteristics of Schottky barrier structure with InAs quantum dots grown on InAlAs/InP(001)

    New search for: Baira, M.
    New search for: Ajjel, R.
    New search for: Maaref, H.
    New search for: Salem, B.
    New search for: Brémond, G.
    New search for: Gendry, M.
    New search for: Marty, O.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
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    Document information
    Title:

    Capacitance–voltage profile characteristics of Schottky barrier structure with InAs quantum dots grown on InAlAs/InP(001)

    Contributors:

    Baira, M. (author) / Ajjel, R. (author) / Maaref, H. (author) / Salem, B. (author) / Brémond, G. (author) / Gendry, M. (author) / Marty, O. (author)

    Published in:

    MATERIALS SCIENCE AND ENGINEERING -AMSTERDAM THEN LAUSANNE- C ; 26 ; 583-585

    Publication date:

    2006-01-01

    Size:

    3 pages

    ISSN:

    0928-4931

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.1 / 660

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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