Fachinformationsdienst BAUdigital

A platform for research: civil engineering, architecture and urbanism

    Characterization of a SiC/SiC composite by X-ray diffraction, atomic force microscopy and positron spectroscopies

    New search for: Brauer, G.
    New search for: Anwand, W.
    New search for: Eichhorn, F.
    New search for: Skorupa, W.
    New search for: Hofer, C.
    New search for: Teichert, C.
    New search for: Kuriplach, J.
    New search for: Cizek, J.
    New search for: Prochazka, I.
    New search for: Coleman, P. G.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Characterization of a SiC/SiC composite by X-ray diffraction, atomic force microscopy and positron spectroscopies

    New search for: Brauer, G.
    New search for: Anwand, W.
    New search for: Eichhorn, F.
    New search for: Skorupa, W.
    New search for: Hofer, C.
    New search for: Teichert, C.
    New search for: Kuriplach, J.
    New search for: Cizek, J.
    New search for: Prochazka, I.
    New search for: Coleman, P. G.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Characterization of a SiC/SiC composite by X-ray diffraction, atomic force microscopy and positron spectroscopies

    New search for: Brauer, G.
    New search for: Anwand, W.
    New search for: Eichhorn, F.
    New search for: Skorupa, W.
    New search for: Hofer, C.
    New search for: Teichert, C.
    New search for: Kuriplach, J.
    New search for: Cizek, J.
    New search for: Prochazka, I.
    New search for: Coleman, P. G.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Characterization of a SiC/SiC composite by X-ray diffraction, atomic force microscopy and positron spectroscopies

    Contributors:

    Brauer, G. (author) / Anwand, W. (author) / Eichhorn, F. (author) / Skorupa, W. (author) / Hofer, C. (author) / Teichert, C. (author) / Kuriplach, J. (author) / Cizek, J. (author) / Prochazka, I. (author) / Coleman, P. G. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 252 ; 3342-3351

    Publication date:

    2006-01-01

    Size:

    10 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

    Similar titles

    Atomic Force Microscopy

    West, P. / Starostina, N. | British Library Online Contents | 2004

    Atomic Force Microscopy

    Blanchard, C. R. / Campbell, J. B. | British Library Online Contents | 1995

    Electron and positron spectroscopies in materials science and engineering

    American Institute of Mining, Metallurgical, and Petroleum Engineers | TIBKAT | 1979

    Surface characterization of natural graphite powder composite electrodes by atomic force microscopy

    Fournier, J. / Menard, H. / Brossard, L. et al. | British Library Online Contents | 1996

    Characterization of quantum structures by atomic-force microscopy

    Wullner, D. / Schlachetzki, A. / Bonsch, P. et al. | British Library Online Contents | 1998

    Back to top