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    Reliability of Micro/Nano-Electromechanical System in Environment of Electrostatic Field, Casimir Force and Residual Stress

    New search for: Fengzhang, R.
    New search for: Lihong, Z.
    New search for: Ping, L.

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    Reliability of Micro/Nano-Electromechanical System in Environment of Electrostatic Field, Casimir Force and Residual Stress

    New search for: Fengzhang, R.
    New search for: Lihong, Z.
    New search for: Ping, L.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Reliability of Micro/Nano-Electromechanical System in Environment of Electrostatic Field, Casimir Force and Residual Stress

    New search for: Fengzhang, R.
    New search for: Lihong, Z.
    New search for: Ping, L.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

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    Check availability in my library
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    Document information
    Similar titles

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    Document information
    Title:

    Reliability of Micro/Nano-Electromechanical System in Environment of Electrostatic Field, Casimir Force and Residual Stress

    Contributors:

    Fengzhang, R. (author) / Lihong, Z. (author) / Ping, L. (author)

    Published in:

    RARE METAL MATERIALS AND ENGINEERING ; 34 ; 1524-1527

    Publication date:

    2005-01-01

    Size:

    4 pages

    ISSN:

    1002-185X

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    Unknown

    Classification:

    DDC:  669

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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