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    Residual stress and Curie temperature of Fe-N thin films prepared by dc magnetron sputtering at elevated temperature

    New search for: Li, W. L.
    New search for: Sun, Y.
    New search for: Fei, W. D.

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    Residual stress and Curie temperature of Fe-N thin films prepared by dc magnetron sputtering at elevated temperature

    New search for: Li, W. L.
    New search for: Sun, Y.
    New search for: Fei, W. D.

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    Residual stress and Curie temperature of Fe-N thin films prepared by dc magnetron sputtering at elevated temperature

    New search for: Li, W. L.
    New search for: Sun, Y.
    New search for: Fei, W. D.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
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    Document information
    Similar titles

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    Document information
    Title:

    Residual stress and Curie temperature of Fe-N thin films prepared by dc magnetron sputtering at elevated temperature

    Contributors:

    Li, W. L. (author) / Sun, Y. (author) / Fei, W. D. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 252 ; 4995-5001

    Publication date:

    2006-01-01

    Size:

    7 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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