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Electronic structure of CeAl2 thin films studied by X-ray absorption spectroscopy

Dong, C. L. / Chen, C. L. / Chen, Y. Y. / Asokan, K. / Lee, J. F. / Guo, J. H. / Chang, C. L.

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Electronic structure of CeAl2 thin films studied by X-ray absorption spectroscopy

Dong, C. L. / Chen, C. L. / Chen, Y. Y. / Asokan, K. / Lee, J. F. / Guo, J. H. / Chang, C. L.

Electronic structure of CeAl2 thin films studied by X-ray absorption spectroscopy

Dong, C. L. / Chen, C. L. / Chen, Y. Y. / Asokan, K. / Lee, J. F. / Guo, J. H. / Chang, C. L.

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Document information

Title:

Electronic structure of CeAl2 thin films studied by X-ray absorption spectroscopy

Contributors:

Dong, C. L. (author) / Chen, C. L. (author) / Chen, Y. Y. (author) / Asokan, K. (author) / Lee, J. F. (author) / Guo, J. H. (author) / Chang, C. L. (author)

Published in:

APPLIED SURFACE SCIENCE ; 252 ; 5372-5375

Publication date:

2006-01-01

Size:

4 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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