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Dx-like defects in AlGaN/GaN structures by means of noise spectroscopy

Seghier, D. / Gislason, H. P.

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Dx-like defects in AlGaN/GaN structures by means of noise spectroscopy

Seghier, D. / Gislason, H. P.

Dx-like defects in AlGaN/GaN structures by means of noise spectroscopy

Seghier, D. / Gislason, H. P.

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Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Dx-like defects in AlGaN/GaN structures by means of noise spectroscopy

Contributors:

Seghier, D. (author) / Gislason, H. P. (author)

Published in:

MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING ; 9 ; 41-44

Publication date:

2006-01-01

Size:

4 pages

ISSN:

1369-8001

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.38152

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