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TEM characterisation of defects, strains and local electric fields in AlGaN/InGaN/GaN structures
TEM characterisation of defects, strains and local electric fields in AlGaN/InGaN/GaN structures
TEM characterisation of defects, strains and local electric fields in AlGaN/InGaN/GaN structures
Cherns, D. (author)
MATERIALS SCIENCE AND ENGINEERING B -LAUSANNE- ; 91-92 ; 274 - 279
2002-01-01
6 pages
Article (Journal)
English
DDC:
620.11
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