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Studies of the Dynamics of Thin Ion Exchange Films by Spectroscopic Ellipsometry and Attenuated Total Reflectance Spectroscopy
Studies of the Dynamics of Thin Ion Exchange Films by Spectroscopic Ellipsometry and Attenuated Total Reflectance Spectroscopy
Studies of the Dynamics of Thin Ion Exchange Films by Spectroscopic Ellipsometry and Attenuated Total Reflectance Spectroscopy
Pantelic, N. (author) / Piruska, A. (author) / Seliskar, C. J. (author) / Uskokovic, D. P. / Milonjic, S. K. / Rakovic, D. I.
2006-01-01
8 pages
Article (Journal)
English
DDC:
620.11
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