In-situ spectroscopic ellipsometry and reflectance difference spectroscopy of GaAs(001) surface reconstructions: Fid-Bau Portal

In-situ spectroscopic ellipsometry and reflectance difference spectroscopy of GaAs(001) surface reconstructions

Wassermeier, M. / Behrend, J. / Zettler, J.-T. / Stahrenberg, K. / Ploog, K. H.

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In-situ spectroscopic ellipsometry and reflectance difference spectroscopy of GaAs(001) surface reconstructions

Wassermeier, M. / Behrend, J. / Zettler, J.-T. / Stahrenberg, K. / Ploog, K. H.

In-situ spectroscopic ellipsometry and reflectance difference spectroscopy of GaAs(001) surface reconstructions

Wassermeier, M. / Behrend, J. / Zettler, J.-T. / Stahrenberg, K. / Ploog, K. H.

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Check availability in my library

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Document information

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Document information

Title:

In-situ spectroscopic ellipsometry and reflectance difference spectroscopy of GaAs(001) surface reconstructions

Contributors:

Wassermeier, M. (author) / Behrend, J. (author) / Zettler, J.-T. (author) / Stahrenberg, K. (author) / Ploog, K. H. (author)

Published in:

APPLIED SURFACE SCIENCE ; 107 ; 48-52

Publication date:

1996-01-01

Size:

5 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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