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Characterisation of electrospun nanowebs with static secondary ion mass spectrometry (S-SIMS)
Characterisation of electrospun nanowebs with static secondary ion mass spectrometry (S-SIMS)
Characterisation of electrospun nanowebs with static secondary ion mass spectrometry (S-SIMS)
Van Royen, P. (author) / dos Santos, A. M. (author) / Schacht, E. (author) / Ruys, L. (author) / Van Vaeck, L. (author)
APPLIED SURFACE SCIENCE ; 252 ; 6992-6995
2006-01-01
4 pages
Article (Journal)
English
DDC:
621.35
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