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High throughput screening of novel oxide conductors using SIMS

Fearn, S. / Rossiny, J. C. / Kilner, J. A. / Zhang, Y. / Chen, L.

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High throughput screening of novel oxide conductors using SIMS

Fearn, S. / Rossiny, J. C. / Kilner, J. A. / Zhang, Y. / Chen, L.

High throughput screening of novel oxide conductors using SIMS

Fearn, S. / Rossiny, J. C. / Kilner, J. A. / Zhang, Y. / Chen, L.

Access

Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

High throughput screening of novel oxide conductors using SIMS

Contributors:

Fearn, S. (author) / Rossiny, J. C. (author) / Kilner, J. A. (author) / Zhang, Y. (author) / Chen, L. (author)

Published in:

APPLIED SURFACE SCIENCE ; 252 ; 7159-7162

Publication date:

2006-01-01

Size:

4 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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