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High throughput screening of novel oxide conductors using SIMS
High throughput screening of novel oxide conductors using SIMS
High throughput screening of novel oxide conductors using SIMS
Fearn, S. (author) / Rossiny, J. C. (author) / Kilner, J. A. (author) / Zhang, Y. (author) / Chen, L. (author)
APPLIED SURFACE SCIENCE ; 252 ; 7159-7162
2006-01-01
4 pages
Article (Journal)
English
DDC:
621.35
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