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XPS depth profiling studies of L-CVD SnO2 thin films

Kwoka, M. / Ottaviano, L. / Passacantando, M. / Santucci, S. / Szuber, J.

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XPS depth profiling studies of L-CVD SnO2 thin films

Kwoka, M. / Ottaviano, L. / Passacantando, M. / Santucci, S. / Szuber, J.

XPS depth profiling studies of L-CVD SnO2 thin films

Kwoka, M. / Ottaviano, L. / Passacantando, M. / Santucci, S. / Szuber, J.

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Check availability in my library

Order at Subito €

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Document information

Title:

XPS depth profiling studies of L-CVD SnO2 thin films

Contributors:

Kwoka, M. (author) / Ottaviano, L. (author) / Passacantando, M. (author) / Santucci, S. (author) / Szuber, J. (author)

Published in:

APPLIED SURFACE SCIENCE ; 252 ; 7730-7733

Publication date:

2006-01-01

Size:

4 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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