Characterization of the Ba(SnxTi1-x)O3 thin films prepared by radio frequency magnetron sputtering: Fid-Bau Portal

Characterization of the Ba(SnxTi1-x)O3 thin films prepared by radio frequency magnetron sputtering

Huang, H. H. / Wang, M. C. / Chen, C. Y. / Wu, N. C. / Lin, H. J.

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Characterization of the Ba(SnxTi1-x)O3 thin films prepared by radio frequency magnetron sputtering

Huang, H. H. / Wang, M. C. / Chen, C. Y. / Wu, N. C. / Lin, H. J.

Characterization of the Ba(SnxTi1-x)O3 thin films prepared by radio frequency magnetron sputtering

Huang, H. H. / Wang, M. C. / Chen, C. Y. / Wu, N. C. / Lin, H. J.

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Check availability in my library

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Document information

Title:

Characterization of the Ba(SnxTi1-x)O3 thin films prepared by radio frequency magnetron sputtering

Contributors:

Huang, H. H. (author) / Wang, M. C. (author) / Chen, C. Y. (author) / Wu, N. C. (author) / Lin, H. J. (author)

Published in:

MATERIALS SCIENCE AND ENGINEERING A ; 433 ; 279-285

Publication date:

2006-01-01

Size:

7 pages

ISSN:

0921-5093

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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