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    Strain analysis of InP/InGaAsP wafer bonded on Si by X-ray double crystalline diffraction

    New search for: Zhao, H. Q.
    New search for: Yu, L. J.
    New search for: Huang, Y. Z.
    New search for: Wang, Y. T.

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    Strain analysis of InP/InGaAsP wafer bonded on Si by X-ray double crystalline diffraction

    New search for: Zhao, H. Q.
    New search for: Yu, L. J.
    New search for: Huang, Y. Z.
    New search for: Wang, Y. T.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Strain analysis of InP/InGaAsP wafer bonded on Si by X-ray double crystalline diffraction

    New search for: Zhao, H. Q.
    New search for: Yu, L. J.
    New search for: Huang, Y. Z.
    New search for: Wang, Y. T.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

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    Check availability in my library
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    Document information
    Similar titles

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    Document information
    Title:

    Strain analysis of InP/InGaAsP wafer bonded on Si by X-ray double crystalline diffraction

    Contributors:

    Zhao, H. Q. (author) / Yu, L. J. (author) / Huang, Y. Z. (author) / Wang, Y. T. (author)

    Published in:

    MATERIALS SCIENCE AND ENGINEERING B -LAUSANNE- ; 133 ; 117-123

    Publication date:

    2006-01-01

    Size:

    7 pages

    ISSN:

    0921-5107

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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