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    Wafer-Scale Strain Engineering of Ultrathin Semiconductor Crystalline Layers

    New search for: Leite, M. S.
    New search for: Warmann, E. C.
    New search for: Kimball, G. M.
    New search for: Burgos, S. P.
    New search for: Callahan, D. M.
    New search for: Atwater, H. A.

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    Wafer-Scale Strain Engineering of Ultrathin Semiconductor Crystalline Layers

    New search for: Leite, M. S.
    New search for: Warmann, E. C.
    New search for: Kimball, G. M.
    New search for: Burgos, S. P.
    New search for: Callahan, D. M.
    New search for: Atwater, H. A.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Wafer-Scale Strain Engineering of Ultrathin Semiconductor Crystalline Layers

    New search for: Leite, M. S.
    New search for: Warmann, E. C.
    New search for: Kimball, G. M.
    New search for: Burgos, S. P.
    New search for: Callahan, D. M.
    New search for: Atwater, H. A.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

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    Document information
    Title:

    Wafer-Scale Strain Engineering of Ultrathin Semiconductor Crystalline Layers

    Contributors:

    Leite, M. S. (author) / Warmann, E. C. (author) / Kimball, G. M. (author) / Burgos, S. P. (author) / Callahan, D. M. (author) / Atwater, H. A. (author)

    Published in:

    ADVANCED MATERIALS -DEERFIELD BEACH THEN WEINHEIM- ; 23 ; 3801-3807

    Publication date:

    2011-01-01

    Size:

    7 pages

    ISSN:

    0935-9648

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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