Nondestructive evaluation of differently doped InP wafers by time-resolved four-wave mixing technique

Kadys, A. / Sudzius, M. / Jarasiunas, K. et al. | British Library Online Contents | 2006

Carrier Generation Lifetime in 4H-SiC Epitaxial Wafers

Chung, G.Y. / Loboda, M.J. / Marninella, M.J. et al. | British Library Online Contents | 2009

Generation and Recombination Carrier Lifetimes in 4H SiC Epitaxial Wafers

Chung, G.Y. / Loboda, M.J. / Marinella, M.J. et al. | British Library Online Contents | 2009

Deep Traps and Charge Carrier Lifetimes in 4H-SiC Epilayers

Huh, S. W. / Sumakeris, J. J. / Polyakov, A. Y. et al. | British Library Online Contents | 2006

Manifestation of Carrier Relaxation Through the Manifold of Localized States in PCDTBT:PC60BM Bulk Heterojunction Material: The Role of PC84BM Traps on the Carrier Transport

Leong, W. L. / Hernandez-Sosa, G. / Cowan, S. R. et al. | British Library Online Contents | 2012