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    The Negative Effect of High-Temperature Annealing on Charge-Carrier Lifetimes in Microcrystalline PCBM

    New search for: Warman, J. M.
    New search for: de Haas, M. P.
    New search for: Anthopoulos, T. D.
    New search for: de Leeuw, D. M.

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    The Negative Effect of High-Temperature Annealing on Charge-Carrier Lifetimes in Microcrystalline PCBM

    New search for: Warman, J. M.
    New search for: de Haas, M. P.
    New search for: Anthopoulos, T. D.
    New search for: de Leeuw, D. M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    The Negative Effect of High-Temperature Annealing on Charge-Carrier Lifetimes in Microcrystalline PCBM

    New search for: Warman, J. M.
    New search for: de Haas, M. P.
    New search for: Anthopoulos, T. D.
    New search for: de Leeuw, D. M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

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    Check availability in my library
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    Document information
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    Document information
    Title:

    The Negative Effect of High-Temperature Annealing on Charge-Carrier Lifetimes in Microcrystalline PCBM

    Contributors:

    Warman, J. M. (author) / de Haas, M. P. (author) / Anthopoulos, T. D. (author) / de Leeuw, D. M. (author)

    Published in:

    ADVANCED MATERIALS -DEERFIELD BEACH THEN WEINHEIM- ; 18 ; 2294-2298

    Publication date:

    2006-01-01

    Size:

    5 pages

    ISSN:

    0935-9648

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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