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Deep Traps and Charge Carrier Lifetimes in 4H-SiC Epilayers
Deep Traps and Charge Carrier Lifetimes in 4H-SiC Epilayers
Deep Traps and Charge Carrier Lifetimes in 4H-SiC Epilayers
Huh, S. W. (author) / Sumakeris, J. J. (author) / Polyakov, A. Y. (author) / Skowronski, M. (author) / Klein, P. B. (author) / Shanabrook, B. V. (author) / O Loughlin, M. J. (author) / Devaty, R. P. / Larkin, D. J. / Saddow, S. E.
2006-01-01
4 pages
Article (Journal)
English
DDC:
620.11
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