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A platform for research: civil engineering, architecture and urbanism
Mechanical Stress Gradients in Thin Films Analyzed Employing X-Ray Diffraction Measurements at Constant Penetration/Information Depths
Mechanical Stress Gradients in Thin Films Analyzed Employing X-Ray Diffraction Measurements at Constant Penetration/Information Depths
Mechanical Stress Gradients in Thin Films Analyzed Employing X-Ray Diffraction Measurements at Constant Penetration/Information Depths
Wohlschlogel, M. (author) / Baumann, W. (author) / Welzel, U. (author) / Mittemeijer, E. J. (author) / Reimers, W. / Quander, S.
2006-01-01
6 pages
Article (Journal)
English
DDC:
620.11
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