An X-Ray Diffraction Method to Determine Stress at Constant Penetration/Information Depth: Fid-Bau Portal

An X-Ray Diffraction Method to Determine Stress at Constant Penetration/Information Depth

Kumar, A. / Welzel, U. / Wohlschlogel, M. / Baumann, W. / Mittemeijer, E. J.

Access

Access via TIB

Check availability in my library

Order at Subito €

Page navigation

Document information

Similar titles

Export, share and cite

An X-Ray Diffraction Method to Determine Stress at Constant Penetration/Information Depth

Kumar, A. / Welzel, U. / Wohlschlogel, M. / Baumann, W. / Mittemeijer, E. J.

An X-Ray Diffraction Method to Determine Stress at Constant Penetration/Information Depth

Kumar, A. / Welzel, U. / Wohlschlogel, M. / Baumann, W. / Mittemeijer, E. J.

Access

Access via TIB

Check availability in my library

Order at Subito €

Page navigation

Document information

Similar titles

Export, share and cite

Document information

Title:

An X-Ray Diffraction Method to Determine Stress at Constant Penetration/Information Depth

Contributors:

Kumar, A. (author) / Welzel, U. (author) / Wohlschlogel, M. (author) / Baumann, W. (author) / Mittemeijer, E. J. (author) / Reimers, W. / Quander, S.

Published in:

Residual Stresses VII: ECRS 7 - Proceedings of the 7^t^h European Conference on Residual Stresses Berlin, Germany, 13-15 September 2006 ; 13-18

MATERIALS SCIENCE FORUM ; 524/525

Publication date:

2006-01-01

Size:

6 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

Bolle, B. / Tidu, A. / Jolly, L. et al. | British Library Online Contents | 2002

Mechanical Stress Gradients in Thin Films Analyzed Employing X-Ray Diffraction Measurements at Constant Penetration/Information Depths

Wohlschlogel, M. / Baumann, W. / Welzel, U. et al. | British Library Online Contents | 2006

Seabed Penetration System and Estimation Method for Penetration Depth

SHIN CHANG JOO / KWON O SOON / JANG IN SUNG et al. | European Patent Office | 2021

Free access

Use of Full-Displacement Penetration Tests to Determine in Situ Lateral Stress

Sully, J. P. | British Library Conference Proceedings | 1994

Residual stress and strain-free lattice-parameter depth profiles in a gamma '-Fe~4N~1~-~x layer on an alpha -Fe substrate measured by x-ray diffraction stress analysis at constant information depth

Wohlschlogel, M. / Welzel, U. / Mittemeijer, E.J. | British Library Online Contents | 2009