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Evaluation of Young's Modulus and Residual Stress of NiFe Film by Microbridge Testing

Zhou, Z. / Zhou, Y. / Wang, M. / Yang, C. / Chen, J. / Ding, W. / Gao, X. / Zhang, T.

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Evaluation of Young's Modulus and Residual Stress of NiFe Film by Microbridge Testing

Zhou, Z. / Zhou, Y. / Wang, M. / Yang, C. / Chen, J. / Ding, W. / Gao, X. / Zhang, T.

Evaluation of Young's Modulus and Residual Stress of NiFe Film by Microbridge Testing

Zhou, Z. / Zhou, Y. / Wang, M. / Yang, C. / Chen, J. / Ding, W. / Gao, X. / Zhang, T.

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Check availability in my library

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Document information

Title:

Evaluation of Young's Modulus and Residual Stress of NiFe Film by Microbridge Testing

Contributors:

Zhou, Z. (author) / Zhou, Y. (author) / Wang, M. (author) / Yang, C. (author) / Chen, J. (author) / Ding, W. (author) / Gao, X. (author) / Zhang, T. (author)

Published in:

JOURNAL OF MATERIALS SCIENCE AND TECHNOLOGY -SHENYANG- ; 22 ; 345-348

Publication date:

2006-01-01

Size:

4 pages

ISSN:

1005-0302

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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