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Effect of Young's modulus evolution on residual stress measurement of thermal barrier coatings by X-ray diffraction
Effect of Young's modulus evolution on residual stress measurement of thermal barrier coatings by X-ray diffraction
Effect of Young's modulus evolution on residual stress measurement of thermal barrier coatings by X-ray diffraction
Chen, Q. (author) / Mao, W. G. (author) / Zhou, Y. C. (author) / Lu, C. (author)
APPLIED SURFACE SCIENCE ; 256 ; 7311-7315
2010-01-01
5 pages
Article (Journal)
English
DDC:
621.35
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