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Effects of Si doping on the structural and electrical properties of Ge2Sb2Te5 films for phase change random access memory
Effects of Si doping on the structural and electrical properties of Ge2Sb2Te5 films for phase change random access memory
Effects of Si doping on the structural and electrical properties of Ge2Sb2Te5 films for phase change random access memory
APPLIED SURFACE SCIENCE ; 252 ; 8404-8409
2006-01-01
6 pages
Article (Journal)
English
DDC:
621.35
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