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A platform for research: civil engineering, architecture and urbanism
Nondestructive and Non-Contact Characterization Technique for Metal Thin Films Using a Near-Field Microwave Microprobe
Nondestructive and Non-Contact Characterization Technique for Metal Thin Films Using a Near-Field Microwave Microprobe
Nondestructive and Non-Contact Characterization Technique for Metal Thin Films Using a Near-Field Microwave Microprobe
Yoo, H. J. (author) / Kim, J. C. (author) / Babajayan, A. (author) / Kim, S. H. (author) / Lee, K. J. (author) / Lee, S.-S. / Lee, J. H. / Park, I. K. / Song, S.-J. / Choi, M. Y.
2006-01-01
4 pages
Article (Journal)
English
DDC:
620.11
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