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Study of process induced variation in the minority carrier lifetime of silicon during solar cells fabrication

Dhungel, S. K. / Yoo, J. / Kim, K. / Ghosh, S. / Jung, S. / Yi, J.

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Study of process induced variation in the minority carrier lifetime of silicon during solar cells fabrication

Dhungel, S. K. / Yoo, J. / Kim, K. / Ghosh, S. / Jung, S. / Yi, J.

Study of process induced variation in the minority carrier lifetime of silicon during solar cells fabrication

Dhungel, S. K. / Yoo, J. / Kim, K. / Ghosh, S. / Jung, S. / Yi, J.

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Check availability in my library

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Document information

Title:

Study of process induced variation in the minority carrier lifetime of silicon during solar cells fabrication

Contributors:

Dhungel, S. K. (author) / Yoo, J. (author) / Kim, K. (author) / Ghosh, S. (author) / Jung, S. (author) / Yi, J. (author)

Published in:

MATERIALS SCIENCE AND ENGINEERING B -LAUSANNE- ; 134 ; 287-290

Publication date:

2006-01-01

Size:

4 pages

ISSN:

0921-5107

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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