Advances in modulation spectroscopy: State-of-art photoreflectance metrology: Fid-Bau Portal

Advances in modulation spectroscopy: State-of-art photoreflectance metrology

Murtagh, M. E. / Ward, S. / Nee, D. / Kelly, P. V.

Access

Access via TIB

Check availability in my library

Order at Subito €

Page navigation

Document information

Similar titles

Export, share and cite

Advances in modulation spectroscopy: State-of-art photoreflectance metrology

Murtagh, M. E. / Ward, S. / Nee, D. / Kelly, P. V.

Advances in modulation spectroscopy: State-of-art photoreflectance metrology

Murtagh, M. E. / Ward, S. / Nee, D. / Kelly, P. V.

Access

Access via TIB

Check availability in my library

Order at Subito €

Page navigation

Document information

Similar titles

Export, share and cite

Document information

Title:

Advances in modulation spectroscopy: State-of-art photoreflectance metrology

Contributors:

Murtagh, M. E. (author) / Ward, S. (author) / Nee, D. (author) / Kelly, P. V. (author)

Published in:

APPLIED SURFACE SCIENCE ; 253 ; 145-151

Publication date:

2006-01-01

Size:

7 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

Kudrawiec, R. / Sek, G. / Ryczko, K. et al. | British Library Online Contents | 2003

Semiconductor heterostructures and device structures investigated by photoreflectance spectroscopy

Misiewicz, J. / Sitarek, P. / Sek, G. et al. | British Library Online Contents | 2003

Photoreflectance study of crystalline silicon

Moriya, H. / Kaneta, A. / Adachi, S. | British Library Online Contents | 2000

Photoreflectance investigations of GaN epitaxial layers

Sitarek, P. / Kudrawiec, R. / Sek, G. et al. | British Library Online Contents | 2001

Photoreflectance investigations of semiconductor device structures

Soares, J. A. N. T. / Beliaev, D. / Enderlein, R. et al. | British Library Online Contents | 1995