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    High-resolution electron holography for the study of composition and strain in thin film semiconductors

    New search for: Houdellier, F.
    New search for: Hytch, M. J.
    New search for: Snoeck, E.
    New search for: Casanove, M. J.

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    High-resolution electron holography for the study of composition and strain in thin film semiconductors

    New search for: Houdellier, F.
    New search for: Hytch, M. J.
    New search for: Snoeck, E.
    New search for: Casanove, M. J.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    High-resolution electron holography for the study of composition and strain in thin film semiconductors

    New search for: Houdellier, F.
    New search for: Hytch, M. J.
    New search for: Snoeck, E.
    New search for: Casanove, M. J.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
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    Document information
    Title:

    High-resolution electron holography for the study of composition and strain in thin film semiconductors

    Contributors:

    Houdellier, F. (author) / Hytch, M. J. (author) / Snoeck, E. (author) / Casanove, M. J. (author)

    Published in:

    MATERIALS SCIENCE AND ENGINEERING B -LAUSANNE- ; 135 ; 188-191

    Publication date:

    2006-01-01

    Size:

    4 pages

    ISSN:

    0921-5107

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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