Y2O3 stabilized ZrO2 thin films deposited by electron beam evaporation: Structural, morphological characterization and laser induced damage threshold: Fid-Bau Portal

Y2O3 stabilized ZrO2 thin films deposited by electron beam evaporation: Structural, morphological characterization and laser induced damage threshold

Wu, S. G. / Zhang, H. Y. / Tian, G. L. / Xia, Z. L. / Shao, J. D. / Fan, Z. X.

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Y2O3 stabilized ZrO2 thin films deposited by electron beam evaporation: Structural, morphological characterization and laser induced damage threshold

Wu, S. G. / Zhang, H. Y. / Tian, G. L. / Xia, Z. L. / Shao, J. D. / Fan, Z. X.

Y2O3 stabilized ZrO2 thin films deposited by electron beam evaporation: Structural, morphological characterization and laser induced damage threshold

Wu, S. G. / Zhang, H. Y. / Tian, G. L. / Xia, Z. L. / Shao, J. D. / Fan, Z. X.

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Document information

Title:

Y2O3 stabilized ZrO2 thin films deposited by electron beam evaporation: Structural, morphological characterization and laser induced damage threshold

Contributors:

Wu, S. G. (author) / Zhang, H. Y. (author) / Tian, G. L. (author) / Xia, Z. L. (author) / Shao, J. D. (author) / Fan, Z. X. (author)

Published in:

APPLIED SURFACE SCIENCE ; 253 ; 1561-1565

Publication date:

2006-01-01

Size:

5 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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