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Y2O3 stabilized ZrO2 thin films deposited by electron beam evaporation: Structural, morphological characterization and laser induced damage threshold
Y2O3 stabilized ZrO2 thin films deposited by electron beam evaporation: Structural, morphological characterization and laser induced damage threshold
Y2O3 stabilized ZrO2 thin films deposited by electron beam evaporation: Structural, morphological characterization and laser induced damage threshold
Wu, S. G. (Autor:in) / Zhang, H. Y. (Autor:in) / Tian, G. L. (Autor:in) / Xia, Z. L. (Autor:in) / Shao, J. D. (Autor:in) / Fan, Z. X. (Autor:in)
APPLIED SURFACE SCIENCE ; 253 ; 1561-1565
01.01.2006
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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