A platform for research: civil engineering, architecture and urbanism
Ellipsometric and XPS Studies of 4H-SiC/SiO~2 Interfaces, and Sacrificial Oxide Stripped 4H-SiC Surfaces
Ellipsometric and XPS Studies of 4H-SiC/SiO~2 Interfaces, and Sacrificial Oxide Stripped 4H-SiC Surfaces
Ellipsometric and XPS Studies of 4H-SiC/SiO~2 Interfaces, and Sacrificial Oxide Stripped 4H-SiC Surfaces
Guy, O. J. (author) / Chen, L. (author) / Pope, G. (author) / Teng, K. S. (author) / Maffeis, T. (author) / Wilks, S. P. (author) / Mawby, P. A. (author) / Jenkins, T. (author) / Brieva, A. (author) / Hayton, D. J. (author)
Silicon Carbide and Related Materials - 2005 ; 1027-1030
MATERIALS SCIENCE FORUM ; 527/529
2006-01-01
4 pages
Article (Journal)
English
DDC:
620.11
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Ellipsometric Study of Thermal Silicon Oxide and Sacrificial Silicon Oxide on 4H-SiC
British Library Online Contents | 2004
|Ellipsometric analysis of poly(3-hexylthiophene) surfaces
British Library Online Contents | 1993
|British Library Conference Proceedings | 2004
|