Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Ellipsometric and XPS Studies of 4H-SiC/SiO~2 Interfaces, and Sacrificial Oxide Stripped 4H-SiC Surfaces
Ellipsometric and XPS Studies of 4H-SiC/SiO~2 Interfaces, and Sacrificial Oxide Stripped 4H-SiC Surfaces
Ellipsometric and XPS Studies of 4H-SiC/SiO~2 Interfaces, and Sacrificial Oxide Stripped 4H-SiC Surfaces
Guy, O. J. (Autor:in) / Chen, L. (Autor:in) / Pope, G. (Autor:in) / Teng, K. S. (Autor:in) / Maffeis, T. (Autor:in) / Wilks, S. P. (Autor:in) / Mawby, P. A. (Autor:in) / Jenkins, T. (Autor:in) / Brieva, A. (Autor:in) / Hayton, D. J. (Autor:in)
Silicon Carbide and Related Materials - 2005 ; 1027-1030
MATERIALS SCIENCE FORUM ; 527/529
01.01.2006
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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